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NX3V1G66 Datasheet(PDF) 9 Page - NXP Semiconductors |
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NX3V1G66 Datasheet(HTML) 9 Page - NXP Semiconductors |
9 / 18 page NX3V1G66_5 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 05 — 24 March 2010 9 of 18 NXP Semiconductors NX3V1G66 Low-ohmic single-pole single-throw analog switch 12.1 Waveform and test circuits Measurement points are given in Table 10. Logic level: VOH is the typical output voltage that occurs with the output load. Fig 15. Enable and disable times 001aah875 Y output OFF to HIGH HIGH to OFF E input VI VOH GND GND VM ten tdis VX VX switch enabled switch disabled switch disabled Table 10. Measurement points Supply voltage Input Output VCC VM VX 1.4 V to 4.3 V 0.5VCC 0.9VOH Test data is given in Table 11. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. VEXT = External voltage for measuring switching times. Fig 16. Load circuit for switching times 001aah377 E Y/Z Z/Y RL CL VCC VEXT = 1.5 V VI V VO G Table 11. Test data Supply voltage Input Load VCC VI tr, tf CL RL 1.4 V to 4.3 V VCC ≤ 2.5 ns 35 pF 50 Ω |
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