MPXC2011DT1

Sensors

Freescale Semiconductor

3

Pressure

MAXIMUM RATINGS

OPERATING CHARACTERISTICS

1. Exposure beyond the specified limits may cause permanent damage or degradation to the device.

Rating

Symbol

Value

Unit

Maximum Pressure (Backside)

75

kPa

Storage Temperature

-25 to +85

°C

Operating Temperature

+15 to +40

°C

Characteristic

Symbol

Min

Typ

Max

Unit

0—

10

kPa

—3

10

Vdc

Supply Current

—6.0

—

mAdc

24

25

26

mV

-1.0

—

1.0

mV

Sensitivity

ΔV/ΔP—

2.5

—

mV/kPa

—

-1.0

—

1.0

——

±0.1

—

°C to +40°C)

——

±0.1

—

-1.0

—

1.0

-1.0

—

1.0

mV

Input Impedance

1300

—

2550

Ω

Output Impedance

1400

—

3000

Ω

—1.0

—

ms

Warm-Up

—

—

20

v

ms

——

±0.5

—

1. 1.0 kPa (kiloPascal) equals 0.145 psi.

2. Device is ratiometric within this specified excitation range. Operating the device above the specified excitation range may induce additional

error due to device self-heating.

minimum rated pressure.

5. Accuracy (error budget) consists of the following:

Linearity:

Output deviation from a straight line relationship with pressure, using end point method, over the specified

pressure range.

Temperature Hysteresis:

Output deviation at any temperature within the operating temperature range, after the temperature is cycled to

and from the minimum or maximum operating temperature points, with zero differential pressure applied.

Pressure Hysteresis:

Output deviation at any pressure within the specified range, when this pressure is cycled to and from the

minimum or maximum rated pressure, at 25

°C.

TcSpan:

Output deviation at full rated pressure over the temperature range of 0 to 85

°C, relative to 25°C.

TcOffset:

Output deviation with minimum rated pressure applied, over the temperature range of 0 to 85

°C, relative to 25°C.

6. Response Time is defined as the time for the incremental change in the output to go from 10% to 90% of its final value when subjected to a

specified step change in pressure.

7. Offset stability is the product's output deviation when subjected to 1000 hours of Pulsed Pressure, Temperature Cycling with Bias Test.