PMEG2010ER_1

© NXP B.V. 2008. All rights reserved.

Product data sheet

Rev. 01 — 29 December 2008

9 of 13

NXP Semiconductors

PMEG2010ER

8.

Test information

The current ratings for the typical waveforms as shown in Figure 9, 10, 11 and 12 are

calculated according to the equations:

at DC, and

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard

Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

9.

Package outline

Fig 13. Duty cycle definition

P

t

006aaa812

duty cycle

δ =

I

FAV

()

I

M

δ

×

=

I

RMS

I

FAV

(

)

=

I

RMS

I

M

δ

×

=

Fig 14. Package outline SOD123W

08-11-06

Dimensions in mm

2.8

2.4

3.7

3.3

1.05

0.75

1.9

1.5

1

2

0.6

0.3

0.22

0.10

1.1

0.9