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NCP3218AMNR2G Datasheet(PDF) 8 Page - ON Semiconductor |
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NCP3218AMNR2G Datasheet(HTML) 8 Page - ON Semiconductor |
8 / 35 page ADP3212A, NCP3218A http://onsemi.com 8 ELECTRICAL CHARACTERISTICS VCC = PVCC = 5.0 V, FBRTN = PGND = GND = 0 V, H = 5.0 V, L = 0 V, EN = VARFREQ = H, DPRSLP = L, PSI = 1.05 V, VVID = VDAC = 1.2000 V, TA = −40°C to 100°C, unless otherwise noted. (Note 1) Current entering a pin (sink current) has a positive sign. Parameter Units Max Typ Min Conditions Symbol SYSTEM I/O BUFFERS VID[6:0], DPRSLP, PSI INPUTS Input Voltage Refers to driving signal level Logic low Logic high 2.0 0.3 V Input Current V = 0.2 V, VID[6:0], DPRSLP (active pulldown to GND) PSI (active pullup to VCC) 1.0 −2.0 mA VID Delay Time (Note 2) Any VID edge to FB change 10% 200 ns VARFREQ Input Voltage Refers to driving signal level Logic low Logic high 4.0 0.7 V Input Current 1.0 mA EN INPUT Input Voltage Refers to driving signal level Logic low Logic high 1.7 0.5 V Input Current EN = L or EN = H (static) 0.8 V < EN < 1.6 V (during transition) 10 −70 nA mA PH1, PH0 INPUTS Input Voltage Refers to driving signal level Logic low Logic high 2.0 0.5 V Input Current 1.0 mA CLKEN OUTPUT Output Low Voltage Logic low, Isink = 4 mA 60 200 mV Output High, Leakage Current Logic high, VCLKEN = VCC 0.1 mA PWM3, OD3 OUTPUTS Output Voltage Logic low, ISINK = 400 mA Logic high, ISOURCE = −400 mA 4.0 10 5.0 500 mV V THERMAL MONITORING and PROTECTION TTSNS Voltage Range (Note 2) 0 5.0 V TTSNS Threshold VCC = 5.0 V, TTSNS is falling 2.45 2.5 2.55 V TTSNS Hysteresis 50 95 mV TTSNS Bias Current TTSNS = 2.6 V −2.0 2.0 mA VRTT Output Voltage VVRTT Logic low, IVRTT(SINK) = 400 mA Logic high, IVRTT(SOURCE) = −400 mA 4.5 10 5.0 500 mV V SUPPLY Supply Voltage Range VCC 4.5 5.5 V Supply Current EN = high EN = 0 V 7 10 10 50 mA mA VCC OK Threshold VCCOK VCC is rising 4.4 4.5 V VCC UVLO Threshold VCCUVLO VCC is falling 4.0 4.15 V VCC Hysteresis (Note 2) 250 mV HIGH−SIDE MOSFET DRIVER Pullup Resistance, Sourcing Current (Note 3) BST = PVCC 1.25 3.3 W 1. All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC). 2. Guaranteed by design or bench characterization, not production tested. 3. Based on bench characterization data. 4. Timing is referenced to the 90% and 10% points, unless otherwise noted. |
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