CAT93C76

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2

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Temperature Under Bias

−55 to +125

°C

Storage Temperature

−65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

V

−2.0 to +7.0

V

Lead Soldering Temperature (10 seconds)

300

°C

Output Short Circuit Current (Note 2)

100

mA

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. The minimum DC input voltage is −0.5 V. During transitions, inputs may undershoot to −2.0 V for periods of less than 20 ns. Maximum DC

2. Output shorted for no more than one second.

Symbol

Parameter

Reference Test Method

Min

Units

Endurance

MIL−STD−883, Test Method 1033

1,000,000

Cycles / Byte

Data Retention

MIL−STD−883, Test Method 1008

100

Years

ESD Susceptibility

MIL−STD−883, Test Method 3015

2,000

V

Latch−Up

JEDEC Standard 17

100

mA

3. These parameters are tested initially and after a design or process change that affects the parameter.

Symbol

Parameter

Test Conditions

Min

Typ

Max

Units

Power Supply Current (Write)

1

3

mA

Power Supply Current (Read)

300

500

mA

Power Supply Current

(Standby) (x8 Mode)

CS = 0 V, ORG = GND

2

10

mA

Power Supply Current

(Standby) (x16 Mode)

0 (Note 5)

10

mA

Input Leakage Current

0 (Note 5)

10

mA

Output Leakage Current

0 (Note 5)

10

mA

ORG Pin Leakage Current

1

10

mA

Input Low Voltage

−0.1

0.8

V

Input High Voltage

2

V

Input Low Voltage

0

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output High Voltage

2.4

V

Output Low Voltage

0.1

V

Output High Voltage

V

5. 0 mA is defined as less than 900 nA.

Symbol

Test

Conditions

Min

Typ

Max

Units

Output Capacitance (DO)

5

pF

Input Capacitance (CS, SK, DI, ORG)

5

pF