CAT525 datasheet(3/16 Pages) ONSEMI

Part #	CAT525

Description	Quad Digitally Programmable Potentiometer (DPP?? with 256 Taps and Microwire Interface

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Not Recommended for New Design

CAT525

3

Doc. No. MD-2001 Rev. J

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Supply Voltage*

VDD to GND

-0.5 to +7

V

Inputs

CLK to GND

-0.5 to VDD +0.5

V

CS to GND

-0.5 to VDD +0.5

V

DI to GND

-0.5 to VDD +0.5

V

RDY/BSY

¯¯¯¯ to GND -0.5 to VDD +0.5

V

PROG to GND

-0.5 to VDD +0.5

V

VREFH to GND

-0.5 to VDD +0.5

V

VREFL to GND

-0.5 to VDD +0.5

V

Parameters

Ratings

Units

Outputs

D0 to GND

-0.5 to VDD +0.5

V

VOUT 1– 4 to GND

-0.5 to VDD +0.5

V

Operating Ambient Temperature

Commercial

(‘C’ or Blank suffix)

0 to +70

°C

Industrial (‘I’ suffix)

-40 to +85

°C

Junction Temperature

+150

°C

Storage Temperature

-65 to +150

°C

Lead Soldering (10 sec max)

+300

°C

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Test Method

Min

Max

Units

VZAP

(2)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

ILTH

(2)(3)

Latch-Up

JEDEC Standard 17

100

mA

POWER SUPPLY

Symbol

Parameter

Conditions

Min

Typ

Max

Units

IDD1

Supply Current (Read)

Normal Operating

—

400

600

µA

Programming, VDD = 5V

—

1600

2500

µA

IDD2

Supply Current (Write)

VDD = 3V

—

1000

1600

µA

VDD

Operating Voltage Range

2.7

—

5.5

V

LOGIC INPUTS

Symbol

Parameter

Conditions

Min

Typ

Max

Units

IIH

Input Leakage Current

VIN = VDD

—

10

µA

IIL

Input Leakage Current

VIN = 0V

—

-10

µA

VIH

High Level Input Voltage

2

—

VDD

V

VIL

Low Level Input Voltage

0

—

0.8

V

LOGIC OUTPUTS

Symbol

Parameter

Conditions

Min

Typ

Max

Units

VOH

High Level Output Voltage

IOH = -40µA

VDD -0.3

—

V

IOL = 1 mA, VDD = +5V

—

0.4

V

VOL

Low Level Output Voltage

IOL = 0.4 mA, VDD = +3V

—

0.4

V

Notes:

(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this

specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

(2) This parameter is tested initially and after a design or process change that affects the parameter.

(3) Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC + 1V.

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