OPA1641

OPA1642

OPA1644

SBOS484A – DECEMBER 2009 – REVISED APRIL 2010

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range (unless otherwise noted).

VALUE

UNIT

40

V

(V–) –0.5 to (V+) +0.5

V

±10

mA

Differential Input Voltage

V

Continuous

–55 to +125

°C

–65 to +150

°C

+150

°C

Human Body Model (HBM)

3000

V

ESD Ratings

Charged Device Model (CDM)

1000

V

Machine Model (MM)

100

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current-limited to 10mA or less.

(3)

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

SO-8

D

O1641A

OPA1641

MSOP-8

DGK

1641

SO-8

D

O1642A

OPA1642

MSOP-8

DGK

1642

SO-14

D

O1644AG4

OPA1644

TSSOP-14

PW

O1644A

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

2

Copyright © 2009–2010, Texas Instruments Incorporated

Product Folder Link(s): OPA1641 OPA1642 OPA1644