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ISO3086DWG4 Datasheet(PDF) 4 Page - Texas Instruments |
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ISO3086DWG4 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 19 page 0 or I I VI V CC1 DE A B VOB VOA VOD IOA IOB GND1 GND1 GND2 V CC1 GND2 375 W 60 W + V OD - D DE GND2 V CC2 A B - 7 Vto12 V 0 or3 V 375 W ISO3080, ISO3086 ISO3082, ISO3088 SLOS581C – MAY 2008 – REVISED OCTOBER 2009 www.ti.com RECEIVER ELECTRICAL CHARACTERISTICS over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Positive-going input threshold VIT(+) IO = –8 mA –85 –10 mV voltage Negative-going input threshold VIT(–) IO = 8 mA –200 –115 mV voltage Vhys Hysteresis voltage (VIT+ – VIT–) 30 mV VCC1- 3.3-V VCC1 3.1 VID = 200 mV, IO = –8 mA, 0.4 VOH High-level output voltage V See Figure 7 5-V VCC1 4 4.8 3.3-V VCC1 0.15 0.4 VID = –200 mV, IO = 8 mA, VOL Low-level output voltage V See Figure 7 5-V VCC1 0.15 0.4 IO(Z) High-impedance state output current VI = –7 to 12 V, Other input = 0 V –1 1 μA VA or VB = 12 V 0.04 0.1 VA or VB = 12 V, VCC = 0 0.06 0.13 II Bus input current Other input at 0 V mA VA or VB = –7 V –0.1 –0.04 VA or VB = –7 V, VCC = 0 –0.05 –0.03 IIH High-level input current, RE VIH = 2 V –10 10 μA IIL Low-level input current, RE VIL = 0.8 V –10 10 μA RID Differential input resistance A, B 48 k Ω Test input signal is a 1.5 MHz sine wave with 1Vpp CD Differential input capacitance 7 pF amplitude. CD is measured across A and B. RECEIVER SWITCHING CHARACTERISTICS over recommended operating conditions (unless otherwise noted) PARAMETER TEST MIN TYP MAX UNIT CONDITIONS tPLH, tPHL Propagation delay 90 125 ns PWD(1) Pulse width distortion |tPHL – tPLH| See Figure 8 4 12 tr, tf Output signal rise and fall time 1 ns tPZH, Propagation delay, high-level-to-high-impedance output See Figure 9, 22 ns DE at 0 V tPZL Propagation delay, high-impedance-to-high-level output tPHZ, Propagation delay, high-impedance-to-low-level output See Figure 10, 22 ns DE at 0 V tPLZ Propagation delay, low-level-to-high-impedance output (1) lso known as pulse skew. PARAMETER MEASUREMENT INFORMATION Figure 1. Driver VOD Test and Current Definitions Figure 2. Driver VOD With Common-Mode Loading Test Circuit 4 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): ISO3080, ISO3086 ISO3082, ISO3088 |
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