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SN65HVD1040AQDRQ1 Datasheet(PDF) 3 Page - Texas Instruments |
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SN65HVD1040AQDRQ1 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 19 page ABSOLUTE MAXIMUM RATINGS (1) (2) ELECTROSTATIC DISCHARGE PROTECTION RECOMMENDED OPERATING CONDITIONS SN65HVD1040A-Q1 www.ti.com....................................................................................................................................................................................................... SLLS889 – JUNE 2008 VALUE VCC Supply voltage range –0.3 V to 7 V Voltage range at bus terminals (CANH, CANL, SPLIT) –27 V to 40 V IO Receiver output current 20 mA VI Voltage input range, ISO 7637 transient pulse(3) (CANH, CANL) –150 V to 100 V VI Voltage input range (TXD, STB) –0.5 V to 6 V TJ Junction temperature range –40°C to 150°C (1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values, except differential I/O bus voltages, are with respect to network ground terminal. (3) Tested in accordance with ISO 7637 test pulses 1, 2, 3a, 3b per IBEE system level test (Pulse 1 = –100 V, Pulse 2 = 100 V, Pulse 3a = –150 V, Pulse 3b = 100 V). If dc may be coupled with ac transients, externally protect the bus pins within the absolute maximum voltage range at any bus terminal. This device has been tested with dc bus shorts to +40 V with leading common-mode chokes. If common-mode chokes are used in the system and the bus lines may be shorted to dc, ensure that the choke type and value in combination with the node termination and shorting voltage either will not create inductive flyback outside of voltage maximum specification or use an external transient-suppression circuit to protect the transceiver from the inductive transients. PARAMETER TEST CONDITIONS VALUE CANH and CANL(3) ±12 kV Human-Body Model(2) SPLIT(4) ±10 kV Electrostatic discharge(1) All pins ±4 kV Charged-Device Model(5) All pins ±1.5 kV Machine Model(6) ±200 V (1) All typical values at 25°C. (2) Tested in accordance JEDEC Standard 22, Test Method A114E. (3) Test method based upon JEDEC Standard 22 Test Method A114E, CANH and CANL bus pins stressed with respect to each other and GND. (4) Test method based upon JEDEC Standard 22 Test Method A114E, SPLIT pin stressed with respect to GND. (5) Tested in accordance JEDEC Standard 22, Test Method C101C. (6) Tested in accordance JEDEC Standard 22, Test Method A115A. MIN MAX UNIT VCC Supply voltage 4.75 5.25 V VI or VIC Voltage at any bus terminal (separately or common mode) –12 12 V VIH High-level input voltage TXD, STB 2 5.25 V VIL Low-level input voltage TXD, STB 0 0.8 V VID Differential input voltage –6 6 V Driver –70 IOH High-level output current mA Receiver –2 Driver 70 IOL Low-level output current mA Receiver 2 TA Operating free-air temperature range See Thermal Characteristics table –40 125 °C Copyright © 2008, Texas Instruments Incorporated Submit Documentation Feedback 3 |
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