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THS4524 Datasheet(PDF) 2 Page - Texas Instruments |
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THS4524 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 48 page THS4521 THS4522 THS4524 SBOS458D – DECEMBER 2008 – REVISED AUGUST 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED PACKAGE- PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA, PRODUCT LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY THS4521ID Rails, 75 SOIC-8 D TH4521 THS4521IDR Tape and reel, 2500 THS4521 –40°C to +85°C THS4521IDGKT Tape and reel, 250 MSOP-8 DGK 4521 THS4521IDGKR Tape and reel, 2500 THS4522IPW Rails, 90 THS4522 TSSOP-16 PW –40°C to +85°C THS4522 THS4522IPWR Tape and reel, 2000 THS4524IDBT Rails, 50 THS4524 TSSOP-38 DBT –40°C to +85°C THS4524 THS4524IDBTR Tape and reel, 2000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the relevant product folders at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range (unless otherwise noted). PARAMETER THS4521, THS4522. THS4524 UNIT Supply Voltage, VS– to VS+ 5.5 V Input/Output Voltage, VI (VIN±, VOUT±, VOCM pins) (VS–) – 0.7 to (VS+) + 0.7V V Differential Input Voltage, VID 1 V Output Current, IO 100 mA Input Current, II (VIN±, VOCM pins) 10 mA Continuous Power Dissipation See Thermal Characteristic Specifications Maximum Junction Temperature, TJ +150 °C Maximum Junction Temperature, TJ (continuous operation, long-term reliability) +125 °C Operating Free-air Temperature Range, TA –40 to +85 °C Storage Temperature Range, TSTG –65 to +150 °C Human Body Model (HBM) 1300 V ESD Charge Device Model (CDM) 1000 V Rating: Machine Model (MM) 50 V (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2008–2010, Texas Instruments Incorporated Product Folder Link(s): THS4521 THS4522 THS4524 |
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