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K6R4016V1 Datasheet(PDF) 6 Page - Samsung semiconductor

Part # K6R4016V1
Description  1Mx4 Bit High Speed Static RAM(5.0V Operating). Operated at Commercial and Industrial Temperature Ranges.
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Manufacturer  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

K6R4016V1 Datasheet(HTML) 6 Page - Samsung semiconductor

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K6R4004C1D
CMOS SRAM
PRELIMINARY
Rev 1.0
- 6 -
July 2002
Address
Data Out
Previous Valid Data
Valid Data
TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH)
tAA
tRC
tOH
NOTES(READ CYCLE)
1. WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL
levels.
4. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to
device.
5. Transition is measured
±200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.
6. Device is continuously selected with CS=VIL.
7. Address valid prior to coincident with CS transition low.
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
WRITE CYCLE*
* The above parameters are also guaranteed at industrial temperature range.
Parameter
Symbol
K6R4004C1D-10
K6R4004C1D-12
Unit
Min
Max
Min
Max
Write Cycle Time
tWC
10
-
12
-
ns
Chip Select to End of Write
tCW
7
-
8
-
ns
Address Set-up Time
tAS
0
-
0
-
ns
Address Valid to End of Write
tAW
7
-
8
-
ns
Write Pulse Width(OE High)
tWP
7
-
8
-
ns
Write Pulse Width(OE Low)
tWP1
10
-
12
-
ns
Write Recovery Time
tWR
0
-
0
-
ns
Write to Output High-Z
tWHZ
0
5
0
6
ns
Data to Write Time Overlap
tDW
5
-
6
-
ns
Data Hold from Write Time
tDH
0
-
0
-
ns
End of Write to Output Low-Z
tOW
3
-
3
-
ns
Valid Data
High-Z
tRC
CS
Address
OE
Data out
tHZ(3,4,5)
tAA
tCO
tOE
tOLZ
tLZ(4,5)
tOHZ
tPU
tPD
50%
50%
VCC
Current
ICC
ISB
tDH
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)


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