©2005 Fairchild Semiconductor Corporation

www.fairchildsemi.com

TIL111M, TIL117M, MOC8100M Rev. 1.0.2

2

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Symbol

Parameter

Device

Value

Units

TOTAL DEVICE

Storage Temperature

All

-40 to +150

°C

Operating Temperature

All

-40 to +100

°C

Lead Solder Temperature

All

260 for 10 sec

°C

Derate above 25°C

All

250

mW

2.94

mW/°C

EMITTER

DC/Average Forward Input Current

All

60

mA

Reverse Input Voltage

TIL111M

3

V

MOC8100M, TIL117M

6

Forward Current – Peak (300µs, 2% Duty Cycle)

All

3

A

Derate above 25°C

All

120

mW

1.41

mW/°C

DETECTOR

Collector-Emitter Voltage

All

30

V

Collector-Base Voltage

All

70

V

Emitter-Collector Voltage

TIL111M, TIL117M

7

V

Emitter-Base Voltage

All

7

Derate above 25°C

All

150

mW

1.76

mW/°C