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AT77C104B-CH08YV Datasheet(PDF) 8 Page - ATMEL Corporation |
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AT77C104B-CH08YV Datasheet(HTML) 8 Page - ATMEL Corporation |
8 / 46 page 8 5347F–BIOM–3/08 AT77C104B Table 4-3. Resistance Parameter Min Value Standard Method ESD On pins HBM (Human Body Model) CMOS I/O 2 kV MIL-STD-883 method 3015.7 On die surface (zap gun) air discharge ±16 kV NF EN 6100-4-2 Mechanical Abrasion Number of cycles without lubricant Multiply by a factor of 20 for correlation with a real finger 200,000 MIL E 12397B Chemical Resistance Cleaning agent, acid, grease, alcohol, diluted acetone 4 hours Internal method Table 4-4. Explanation of Test Levels Level Description I 100% production tested at +25°C II 100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample) III Sample tested only IV Parameter is guaranteed by design and/or characterization testing V Parameter is a typical value only VI 100% production tested at temperature extremes D 100% probe tested on wafer at T amb = +25°C Table 4-5. Specifications Parameter Symbol Test Level Min Typ Max Unit Resolution IV 50 Micron Size IV 8 × 232 Pixel Yield: Number of bad pixels I 5 Bad pixels Equivalent Resistance on TPP pin I 23 35 47 Ohm |
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