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NX3L1G384GM Datasheet(PDF) 11 Page - NXP Semiconductors |
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NX3L1G384GM Datasheet(HTML) 11 Page - NXP Semiconductors |
11 / 18 page NX3L1G384 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 4 — 7 January 2011 11 of 18 NXP Semiconductors NX3L1G384 Low-ohmic single-pole single-throw analog switch Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads −3dB. Fig 18. Test circuit for measuring the frequency response when channel is in ON-state dB 001aai603 Y/Z E VIL fi RL Z/Y VCC 0.5VCC Adjust fi voltage to obtain 0 dBm level at input. Fig 19. Test circuit for measuring isolation (OFF-state) dB 001aai604 Y/Z E VIH fi RL Z/Y VCC 0.5VCC RL 0.5VCC a. Test circuit b. Input and output pulse definitions Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch VVO 001aai605 RL CL RL VI Y/Z Z/Y E VCC 0.5VCC 0.5VCC G 001aai606 on off off logic input (E) VO Vct |
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