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ZXGD3003E6 Datasheet(PDF) 4 Page - Diodes Incorporated |
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ZXGD3003E6 Datasheet(HTML) 4 Page - Diodes Incorporated |
4 / 8 page ZXGD3003E6 Issue 2 - October 2007 4 www.zetex.com © Zetex Semiconductors plc 2007 Electrical characteristics (at Tamb = 25°C unless otherwise stated). Switching time test circuits Timing diagram Parameter Symbol Min. Typ. Max. Unit Conditions Output voltage, high VOH VCC – 0.4 V Isource = 1 A Output voltage, low VOL 0.4 V Isink = 1 A Source output leakage current IL(source) 1 AVCC = 40V, VIN1 = VIN2 = 0V Sink output leakage current IL(sink) 1 AVCC = 40V, VIN1 = VIN2 = VCC Quiescent current IQ 20 nA VCC = 32V, VIN1 = VIN2 = 0V Source output current I(source) 11.6 A IIN1+IIN2 = 10mA Sink output current I(sink) 11.4 A IIN1+IIN2 = 10mA Source output current I(source)PK 5A IIN1+IIN2 = 500mA Sink output current I(sink)PK 5A IIN1+IIN2 = 500mA Gate driver switching times td(rise) tr td(fall) tf 1.8 8.9 1.7 8.9 ns ns ns ns CL=1nF, RL=1 , VCC=12V, VIN=10V, RS=25 Gate driver switching times td(rise) tr td(fall) tf 4 77 4 85 ns ns ns ns CL=1nF, RL=1 , VCC=12V, VIN=10V, RS=1k |
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