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33910 Datasheet(PDF) 2 Page - Freescale Semiconductor, Inc |
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33910 Datasheet(HTML) 2 Page - Freescale Semiconductor, Inc |
2 / 90 page Analog Integrated Circuit Device Data 2 Freescale Semiconductor 33910 DEVICE VARIATIONS MC33910G5AC/MC3433910G5AC DEVICE VARIATIONS The 33910G5 data sheet is within MC33910G5 Product Specifications Pages 3 to 46 The 33910BAC data sheet is within MC33911BAC Product Specifications Pages 47 to 86 Table 1. This specification support the following products Device Temperature Generation Changes MC33910G5AC/R2 -40 to 125°C 2.5 1. Increase ESD GUN IEC61000-4-2 (gun test contact with 150 pF, 330 W test conditions) performance to achieve ±6.0 kV min on the LIN pin. 2. Immunity against ISO7637 pulse 3b 3. Reduce EMC emission level on LIN 4. Improve EMC immunity against RF – target new specification including 3x68 pF 5. Comply with J2602 conformance test MC34910G5AC/R2 -40 to 85°C 2.5 MC33910BAC/R2 -40 to 125°C 2.0 Initial release MC34910BAC/R2 -40 to 85°C 2.0 |
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