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CY7C12631KV18 Datasheet(PDF) 4 Page - Cypress Semiconductor |
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CY7C12631KV18 Datasheet(HTML) 4 Page - Cypress Semiconductor |
4 / 30 page CY7C12611KV18, CY7C12761KV18 CY7C12631KV18, CY7C12651KV18 Document Number: 001-53193 Rev. *D Page 4 of 30 Contents Pin Configurations ........................................................... 5 165-Ball FBGA (13 x 15 x 1.4 mm) Pinout .................. 5 Functional Overview ........................................................ 9 Read Operations ......................................................... 9 Write Operations ......................................................... 9 Byte Write Operations ................................................. 9 Concurrent Transactions ............................................. 9 Depth Expansion ....................................................... 10 Programmable Impedance ........................................ 10 Echo Clocks .............................................................. 10 Valid Data Indicator (QVLD) ...................................... 10 PLL ............................................................................ 10 Application Example ...................................................... 10 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 13 Disabling the JTAG Feature ...................................... 13 Test Access Port—Test Clock ................................... 13 Test Mode Select (TMS) ........................................... 13 Test Data-In (TDI) ..................................................... 13 Test Data-Out (TDO) ................................................. 13 Performing a TAP Reset ........................................... 13 TAP Registers ........................................................... 13 TAP Instruction Set ................................................... 13 TAP Electrical Characteristics ...................................... 16 TAP AC Switching Characteristics ............................... 17 TAP Timing and Test Conditions .................................. 17 Boundary Scan Order .................................................... 19 Power-Up Sequence in QDR II+ SRAM ......................... 20 Power-Up Sequence ................................................. 20 PLL Constraints ......................................................... 20 Maximum Ratings ........................................................... 21 Operating Range ............................................................ 21 Neutron Soft Error Immunity ......................................... 21 Electrical Characteristics .............................................. 21 DC Electrical Characteristics ..................................... 21 AC Electrical Characteristics ..................................... 22 Capacitance .................................................................... 23 Thermal Resistance ....................................................... 23 Switching Characteristics ............................................. 24 Switching Waveforms .................................................... 25 Read/Write/Deselect Sequence ................................ 25 Ordering Information ..................................................... 26 Ordering Code Definitions ......................................... 26 Package Information ...................................................... 27 Document Conventions ................................................. 28 Acronyms Used ......................................................... 28 Units of Measure ....................................................... 28 Document History Page ................................................. 29 Sales, Solutions, and Legal Information ...................... 30 Worldwide Sales and Design Support ....................... 30 Products .................................................................... 30 PSoC Solutions ......................................................... 30 [+] Feedback |
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