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K4H510438F Datasheet(PDF) 11 Page - Samsung semiconductor

Part # K4H510438F
Description  512Mb F-die DDR SDRAM Specification
Download  24 Pages
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Manufacturer  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

K4H510438F Datasheet(HTML) 11 Page - Samsung semiconductor

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Rev. 1.1 November 2008
DDR SDRAM
K4H510438F
K4H510838F
K4H511638F
11 of 24
Conditions
Symbol
Operating current - One bank Active-Precharge;
tRC=tRCmin; tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400;
DQ,DM and DQS inputs changing once per clock cycle;
address and control inputs changing once every two clock cycles.
IDD0
Operating current - One bank operation ; One bank open, BL=4, Reads
- Refer to the following page for detailed test condition
IDD1
Precharge power-down standby current; All banks idle; power - down mode;
CKE = <VIL(max); tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400;
Vin = Vref for DQ,DQS and DM.
IDD2P
Precharge Floating standby current; CS# > =VIH(min);All banks idle; CKE > = VIH(min), tCK=7.5ns for DDR266,
6ns for DDR333, 5ns for DDR400; Address and other control inputs changing once per clock cycle; Vin = Vref for
DQ,DQS and DM
IDD2F
Precharge Quiet standby current; CS# > = VIH(min); All banks idle;
CKE > = VIH(min); tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400; Address and other control inputs sta-
ble at >= VIH(min) or =<VIL(max); VIN = VREF for DQ ,DQS and DM
IDD2Q
Active power - down standby current ; one bank active; power-down mode;
CKE=< VIL (max) ,tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400;
Vin = Vref for DQ,DQS and DM
IDD3P
Active standby current; CS# >= VIH(min); CKE>=VIH(min);
one bank active; active - precharge; tRC=tRASmax; tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400;
DQ, DQS and DM inputs changing twice per clock cycle; address and other control inputs changing once per clock
cycle
IDD3N
Operating current - burst read; Burst length = 2; reads; continguous burst; One bank active; address and control
inputs changing once per clock cycle; CL=2.5 at tCK=7.5ns for DDR266, tCK=6ns for DDR333, CL=3 at tCK=5ns
for DDR400; 50% of data changing on every transfer; lout = 0 m A
IDD4R
Operating current - burst write; Burst length = 2; writes; continuous burst;
One bank active address and control inputs changing once per clock cycle; CL=2.5 at tCK=7.5ns for DDR266, 6ns
for DDR333, 5ns for DDR400; DQ, DM and DQS inputs changing twice per clock cycle, 50% of input data changing
at every burst
IDD4W
Auto refresh current; tRC = tRFC(min) which is 16*tCK for DDR266 at tCK=7.5ns; 20*tCK for DDR333 at
tCK=6ns, 24*tCK for DDR400 at tCK=5ns; distributed refresh
IDD5
Self refresh current; CKE =< 0.2V; External clock on; tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400.
IDD6
Operating current - Four bank operation ; Four bank interleaving with BL=4
-Refer to the following page for detailed test condition
IDD7A
( TA= 25°C, f=100MHz)
Note :
1.These values are guaranteed by design and are tested on a sample basis only.
2. Although DM is an input -only pin, the input capacitance of this pin must model the input capacitance of the DQ and DQS pins.
This is required to match signal propagation times of DQ, DQS, and DM in the system.
3. Unused pins are tied to ground.
4. This parameteer is sampled. For DDR266 and DDR333 VDDQ = +2.5V +0.2V, VDD = +3.3V +0.3V or +0.25V+0.2V. For DDR400, VDDQ = +2.6V +0.1V,
VDD = +2.6V +0.1V. For all devices, f=100MHz, tA=25°C, Vout(dc) = VDDQ/2, Vout(peak to peak) = 0.2V. DM inputs are grouped with I/O pins -
reflecting the fact that they are matched in loading (to facilitate trace matching at the board level).
Parameter
Symbol
Min
Max
DeltaCap(max)
Unit
Note
Input capacitance
(A0 ~ A12, BA0 ~ BA1, CKE, CS, RAS,CAS, WE)
CIN1
23
0.5
pF
4
Input capacitance( CK, CK )
CIN2
2
3
0.25
pF
4
Data & DQS input/output capacitance
COUT
45
0.5
pF
1,2,3,4
Input capacitance(DM for x4/8, UDM/LDM for x16)
CIN3
4
5
pF
1,2,3,4
12.0 DDR SDRAM IDD Spec Items & Test Conditions
13.0 Input/Output Capacitance


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