CBTD3306

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© NXP B.V. 2011. All rights reserved.

Product Specification

Rev. 5 — 28 April 2011

9 of 17

NXP Semiconductors

CBTD3306

Dual bus switch with level shifting

13. Test information

Test data is given in Table 10.

All input pulses are supplied by generators having the following characteristics: PRR

The outputs are measured one at a time with one transition per measurement.

Definitions for test circuit:

Fig 13. Test circuit for measuring switching times

10 %

90 %

0 V

negative

pulse

positive

pulse

0 V

90 %

10 %

001aae331

DUT

CL

RT

RL

RL

G

Table 10.

Test data

Supply voltage

Input

Load

± 0.5 V

GND to 3.0 V

≤ 2.5 ns

50 pF

500

Ω

open

7.0 V

open