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DS28E10 Datasheet(PDF) 3 Page - Maxim Integrated Products

Part # DS28E10
Description  1-Wire SHA-1 Authenticator Irreversible Write Protection
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Manufacturer  MAXIM [Maxim Integrated Products]
Direct Link  https://www.maximintegrated.com/en.html
Logo MAXIM - Maxim Integrated Products

DS28E10 Datasheet(HTML) 3 Page - Maxim Integrated Products

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1-Wire SHA-1 Authenticator
3
ABRIDGED DATA SHEET
ELECTRICAL CHARACTERISTICS (continued)
(TA = -40NC to +85NC, see Note 1.)
Note 1: Specifications at TA = -40NC are guaranteed by design only and not production tested.
Note 2: Refer to the full data sheet for this note.
Note 3: Guaranteed by design, characterization, and/or simulation only. Not production tested.
Note 4: System requirement.
Note 5: Maximum allowable pullup resistance is a function of the number of 1-Wire devices in the system and 1-Wire recovery
times. The specified value here applies to systems with only one device and with the minimum 1-Wire recovery times.
For more heavily loaded systems, an active pullup such as that found in the DS2482-x00 might be required.
Note 6: Voltage below which, during a falling edge on IO, a logic 0 is detected.
Note 7: The voltage on IO needs to be less than or equal to VILMAX at all times while the master is driving IO to a logic 0 level.
Note 8: Voltage above which, during a rising edge on IO, a logic 1 is detected.
Note 9: After VIH is crossed during a rising edge on IO, the voltage on IO has to drop by at least VHY to be detected as logic 0.
Note 10: The I-V characteristic is linear for voltages less than 1V.
Note 11: Applies to a single DS28E10 attached to a 1-Wire line.
Note 12: The earliest recognition of a negative edge is possible at tREH after VIH has been reached on the preceding rising edge.
Note 13: Defines maximum possible bit rate. Equal to 1/(tW0LMIN + tRECMIN).
Note 14: Interval after tRSTL during which a bus master is guaranteed to sample a logic 0 on IO if there is a DS28E10 present.
Minimum limit is tPDHMAX; maximum limit is tPDHMIN + tPDLMIN.
Note 15: ε in Figure 10 represents the time required for the pullup circuitry to pull the voltage on IO up from VIL to VIH. The actual
maximum duration for the master to pull the line low is tW1LMAX + tF - ε and tW0LMAX + tF - ε, respectively.
Note 16: d in Figure 10 represents the time required for the pullup circuitry to pull the voltage on IO up from VIL to the input high
threshold of the bus master. The actual maximum duration for the master to pull the line low is tRLMAX + tF.
Note 17: Data retention is degraded as TA increases.
Note 18: Guaranteed by 100% production test at elevated temperature for a shorter time; equivalence of this production test to
data sheet limit at operating temperature range is established by reliability testing.
Note 19: Refer to the full data sheet for this note.
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
IO PIN: 1-Wire READ
Read Low Time
(Notes 4, 16)
tRL
Standard speed
5
15 -
d
F
s
Overdrive speed
1
2 -
d
Read Sample Time
(Notes 4, 16)
tMSR
Standard speed
tRL + d
15
F
s
Overdrive speed
tRL + d
2
EPROM
Programming Current
IPROG
VPP = VPP(MAX) (Note 3)
Refer to the full data
sheet.
mA
Programming Time
tPP
ms
Programming Voltage
VPP
(Note 2)
V
Data Retention
tDR
At +85NC (Notes 17, 18)
10
Years
SHA-1 Engine
SHA-1 Computation Current
ICCSHA
VCC = 3.6V
Refer to the full data
sheet.
mA
SHA-1 Computation Time
tCSHA
(Note 19)
ms


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