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C1-1N2S-10 Datasheet(PDF) 5 Page - Superworld Electronics |
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C1-1N2S-10 Datasheet(HTML) 5 Page - Superworld Electronics |
5 / 8 page SUPERWORLD ELECTRONICS (S) PTE LTD NOTE : Specifications subject to change without notice. Please check our website for latest information. PG. 5 04.06.2009 CERAMIC CHIP INDUCTORS C1 SERIES 6. RELIABILITY & TEST CONDITION : Appearance : No mechanical damage. Inductance : Within ±20% of initial value. PERFORMANCE Appearance : No mechanical damage. Inductance : Within ±20% of initial value. Inductance : Within ±20% of initial value. Appearance : No mechanical damage. Vibration Test Thermal Shock ITEM Low Temperature Storage test Frequency : 10-55-10Hz for 1 min. A period of 2 hours in each of 3 mutually perpendicular Directions & times : X, Y, Z directions for 2 hours. directions (Total 6 hours). Amplitude : 1.5mm(peak-peak) TEST CONDITION ambient temperature ambient temperature Temperature : -40°C, +85°C kept stabilized for Measurement : After placing for 24 hours (min.) at room Measurement : After placing for 24 hours (min.) at room Waveform : Sine wave 30 minutes each Cycle : 100 cycles Temperature : -40±2°C Duration : 1008±12hrs |
Similar Part No. - C1-1N2S-10 |
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Similar Description - C1-1N2S-10 |
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