Data Sheet

6

Rev. 1.0, 2010-08-05

TLE 4206-4G

General Product Characteristics

4

General Product Characteristics

4.1

Absolute Maximum Ratings

Note: Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute

maximum rating conditions for extended periods may affect device reliability.

Note: Integrated protection functions are designed to prevent IC destruction under fault conditions described in the

data sheet. Fault conditions are considered as “outside” normal operating range. Protection functions are

not designed for continuous repetitive operation.

T

(unless otherwise specified)

1) Not subject to production test, specified by design.

Pos.

Parameter

Symbol

Limit Values

Unit

Conditions

Min.

Max.

Voltages

4.1.1

Supply voltage

V

S1

-0.3

45

V

–

4.1.2

Supply voltage

V

S2

-1

–

V

I

4.1.3

Logic input voltages

(FB, REF, RANGE, HYST)

V

I

-0.3

20

V

–

Currents

4.1.4

Output current (OUT1, OUT2)

I

OUT

–

–

A

internally limited

4.1.5

Output current (Diode)

I

1

A

–

4.1.6

Input current

(FB, REF, RANGE, HYST)

I

IN

-2

-6

2

6

mA

mA

–

Temperatures

4.1.7

Junction Temperature

T

j

-40

150

°C–

4.1.8

Storage Temperature

T

stg

-50

150

°C–

ESD Susceptibility

4.1.9

ESD resistivity of OUT and

GND

V

ESD

-2

2

kV

2) ESD susceptibility, HBM according to EIA/JESD 22-A114B

4.1.10

ESD Resistivity logic pins to GND

V

ESD5,7

-2

2

kV

HBM2)