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CY7C199D-10VXI Datasheet(PDF) 5 Page - Cypress Semiconductor |
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CY7C199D-10VXI Datasheet(HTML) 5 Page - Cypress Semiconductor |
5 / 14 page CY7C199D Document Number: 38-05471 Rev. *I Page 5 of 14 Capacitance Parameter [2] Description Test Conditions Max Unit CIN Input capacitance TA = 25 C, f = 1 MHz, VCC = 5.0 V 8 pF COUT Output capacitance 8pF Thermal Resistance Parameter [2] Description Test Conditions 28-pin SOJ 28-pin TSOP I Unit JA Thermal resistance (junction to ambient) Still air, soldered on a 3 × 4.5 inch, four-layer printed circuit board 59.16 54.65 C/W JC Thermal resistance (junction to case) 40.84 21.49 C/W AC Test Loads and Waveforms Figure 3. AC Test Loads and Waveforms [3] R2 R1 480 3.0 V GND 90% 10% 90% 10% 5 V OUTPUT 5pF INCLUDING ALL INPUT PULSES * CAPACITIVE LOAD CONSISTS OF ALL COMPONENTS OF THE TEST ENVIRONMENT 30pF* OUTPUT Z = 50 50 1.5 V (a) (c) High Z characteristics: 255 JIG AND SCOPE (b) Rise Time: 3 ns Fall Time: 3 ns Notes 2. Tested initially and after any design or process changes that may affect these parameters. 3. AC characteristics (except high Z) are tested using the load conditions shown in Figure 3 (a). High Z characteristics are tested for all speeds using the test load shown in Figure 3 (c). [+] Feedback |
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