VSP5610

VSP5611

VSP5612

www.ti.com

SBES021

– JUNE 2011

ELECTRICAL CHARACTERISTICS: VSP5612 (continued)

otherwise noted.

VSP5612

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

ANALOG PROGRAMMABLE GAIN (APG)

Gain range

APG_x

0.5

3.5

V/V

Gain step

63

Steps

Gain relative error

Basis gain = 1 V/V

–10

10

%

Gain monotonicity

Only APG_x

Specified

DIGITAL PROGRAMMABLE GAIN (DPG)

Gain range

DPG_x

1.0

2.0

V/V

Gain step

255

Steps

Gain monotonicity

Only DPG_x

Specified

AIN REFERENCE LEVEL (REF_AIN)

Setting code = 2

0.5

V

Setting code = 3

1.1

V

Internal DAC output

Setting code = 0 (default)

1.5

V

Setting code = 1

2.0

V

Internal DAC output tolerance

–10

10

%

Internal DAC output temperature

(2)

–2

2

%

drift

External reference range

0.5

VDD

– 0.9

V

INPUT CLAMP

Internal reference level clamp

V

Clamp level

External reference level clamp

V

Fixed level clamp

2.2

V

Clamp-on resistance

500

Ω

OFFSET DAC

Resolution

8

Bits

Output range

±250

mV

Setting tolerance

–10

10

%

Temperature drift

(2)

–2

2

%

(2)

Specified by design.

THERMAL INFORMATION

VSP561xRSH

RSH

UNITS

56 PINS

Junction-to-ambient thermal resistance

25.8

Junction-to-case (top) thermal resistance

13.2

Junction-to-board thermal resistance

3.5

°C/W

Junction-to-top characterization parameter

0.2

Junction-to-board characterization parameter

3.5

Junction-to-case (bottom) thermal resistance

0.4

(1)

For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.

Copyright

© 2011, Texas Instruments Incorporated

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