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TPS54320RHLR Datasheet(PDF) 2 Page - Texas Instruments |
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TPS54320RHLR Datasheet(HTML) 2 Page - Texas Instruments |
2 / 39 page TPS54320 SLVS982A – AUGUST 2010 – REVISED SEPTEMBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) TJ PACKAGE PART NUMBER(2) –40°C to 150°C 14 Pin QFN TPS54320RHL (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) The RHL package is also available taped and reeled. Add an R suffix to the device type (i.e., TPS54320RHLR). See applications section of data sheet for layout information. ABSOLUTE MAXIMUM RATINGS (1) over operating temperature range (unless otherwise noted) VALUE UNIT VIN –0.3 to 20 V PVIN –0.3 to 20 V EN –0.3 to 6 V BOOT –0.3 to 27 V Input Voltage VSENSE –0.3 to 3 V COMP –0.3 to 3 V PWRGD –0.3 to 6 V SS/TR –0.3 to 3 V RT/CLK –0.3 to 6 V BOOT-PH 0 to 7 V Output Voltage PH –1 to 20 V PH 10ns Transient –3 to 20 V Vdiff GND to exposed thermal pad –0.2 to 0.2 V RT/CLK ±100 mA Source Current PH Current Limit A PH Current Limit A PVIN Current Limit A Sink Current COMP ±200 mA PWRGD –0.1 to 5 mA Electrostatic Discharge (HBM) QSS 009-105 (JESD22-A114A) 2 kV Electrostatic Discharge (CDM) QSS 009-147 (JESD22-C101B.01) 500 V Operating Junction Temperature –40 to 150 °C Storage Temperature –65 to 150 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s) :TPS54320 |
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