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BU9880GUL-WE2 Datasheet(PDF) 2 Page - Rohm |
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BU9880GUL-WE2 Datasheet(HTML) 2 Page - Rohm |
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2 / 17 page  Technical Note 2/16 BU9880GUL-W www.rohm.com 2010.11 - Rev.A © 2010 ROHM Co., Ltd. All rights reserved. ● Memory cell characteristics (Ta=25℃, Vcc=1.7~5.5V) Parameter Limits Unit Min. Typ. Max. Number of data rewrite times *1 1,000,000 － － Times Data hold years *1 40 － － Years *1 Not 100% TESTED ● Electrical characteristics (Unless otherwise specified Ta=-40~85℃, VCC=1.7~5.5V) Parameter Symbol Limits Unit Condition Min Typ. Max. "H" Input Voltage1 VIH1 0.7VCC － VCC+1.0 V "L" Input Voltage1 VIL1 － 0.3 － 0.3Vcc V "L" Output Voltage1 VOL1 － － 0.4 V IOL=3.0mA, 2.5V≦VCC≦5.5V(SDA) "L" Output Voltage2 VOL2 － － 0.2 V IOL=0.7mA, 1.7V≦VCC＜2.5V(SDA) Input Leakage Current ILI － 1 － 1 µA VIN=0V ~ VCC Output Leakage Current ILO － 1 － 1 µA VOUT=0V ~ VCC(SDA) Current consumption at action ICC1 － － 2.0 mA VCC=5.5V , fSCL =400kHz, tWR=5ms Byte Write, Page Write ICC2 － － 0.5 mA VCC=5.5V , fSCL =400kHz Random read, Current read, Sequential read Standby Current ISB － － 2.0 µA VCC=5.5V , SDA・SCL=VCC, WP=GND ○ This product is not designed for protection against radioactive rays. ● Action timing characteristics(Unless otherwise specified Ta=-40 ~ 85℃､VCC=1.7 ~ 5.5V) Parameter Symbol Limits Unit Min. Typ. Max. SCL Frequency fSCL － － 400 kHz Data clock "High" time tHIGH 0.6 － － µs Data clock "Low" time tLOW 1.2 － － µs SDA, SCL rise time *1 tR － － 0.3 µs SDA, SCL fall time *1 tF － － 0.3 µs Start condition hold time tHD:STA 0.6 － － µs Start condition setup time tSU:STA 0.6 － － µs Input data hold time tHD:DAT 0 － － ns Input data setup time tSU:DAT 100 － － ns Output data delay time tPD 0.1 － 0.9 µs Output data hold time tDH 0.1 － － µs Stop condition data setup time tSU:STO 0.6 － － µs Bus release time before transfer start tBUF 1.2 － － µs Internal write cycle time tWR － － 5 ms Noise removal valid period (SDA,SCL terminal) tI － － 0.1 µs WP hold time tHD:WP 0 － － ns WP setup time tSU:WP 0.1 － － µs WP valid time tHIGH:WP 1.0 － － µs *1 : Not 100% TESTED |
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