1) Regulation is measured at constant junction temperature, using pulse testing at a low duty cycle. Changes in output voltage due to

heating effects are covered under thermal regulation specifications.

2) Test Conditions unless othewise stated:

1.238

1.25

1.262

1.220

1.250

1.270

0.005

0.010

0.010

0.020

515

0.1

0.3

15

50

0.3

1

0.002

0.020

65

66

80

50

100

0.2

5

3.5

5

3.5

7

0.50

0.80

0.15

0.20

0.30

12

0.3

1

0.001

13

1.200

1.250

1.300

0.010

0.020

0.020

0.050

515

0.1

0.3

20

50

0.3

1

0.030

0.070

65

66

80

50

100

0.2

5

3.5

5

3.5

7

0.50

0.80

0.15

0.20

0.30

1

0.3

1

0.001

13

IP117MAHV

IP117MHV , IP117M

IP117MA

Parameter

Test Conditions

Min.

Typ.

Max.

Min.

Typ.

Max.

Units

Reference Voltage

Thermal Regulation

Ripple Rejection

Adjust Pin Current

Change

Minimum Load

Current

Current Limit

ΔTEMP Stability

Long Term Stability

ΔTIME

RMS Output Noise

Thermal Resistance

Junction to Case

P

f = 120Hz

t = 1000 Hrs

f = 10 Hz to 10 kHz

LCC4 Package

V

V

% / V

mV

%

mV

%

%/W

dB

dB

μA

μA

mA

A

A

%

%

%

°C/W

IP117MAHVE

IP117MHVE

IP117MAE

Document Number 5383

Issue 1

Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed

to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use.

Semelab encourages customers to verify that datasheets are current before placing orders.