OPA320, OPA2320

OPA320S, OPA2320S

SBOS513D

– AUGUST 2010 – REVISED NOVEMBER 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PACKAGE MARKING,

PRODUCT

PACKAGE-LEAD

DESIGNATOR

QUANTITY

OPA320

SOT23-5

DBV

RAC

SOT23-6

DBV

RAE

MSOP-8

DGK

OCLQ

OPA2320

DFN-8

DRG

OCMQ

SO-8

D

O2320A

MSOP-10

DGS

TBD

(1)

For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or visit

the device product folder at www.ti.com.

(2)

Product preview device.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

OPA320, OPA320S, OPA2320, OPA2320S

UNIT

6

V

(V

–) – 0.5 to (V+) + 0.5

V

Signal input pins

±10

mA

Continuous

mA

–40 to +150

°C

–65 to +150

°C

+150

°C

Human body model (HBM)

4000

V

ESD ratings

Charged device model (CDM)

1000

V

Machine model (MM)

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not implied.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10mA or less.

(3)

Short-circuit to ground, one amplifier per package.

2

Copyright

© 2010–2011, Texas Instruments Incorporated