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ELSS-205SYGWA Datasheet(PDF) 6 Page - Everlight Electronics Co., Ltd |
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ELSS-205SYGWA Datasheet(HTML) 6 Page - Everlight Electronics Co., Ltd |
6 / 8 page Everlight Electronics Co., Ltd. http://www.everlight.com Rev. 3 Page 6 of 8 Device No: DDF-0000121 Prepared date: 2009/5/25 Prepared by: Sun Li ELSS-205SYGWA/S530-E2/S290 ■ Reliability test items and conditions: The reliability of products shall be satisfied with items listed below. Confidence level:90% LTPD:10% NO Item Test Conditions Test Hours/Cycle Sample Size Failure Judgment Criteria Ac/Re 1 Reflow Soldering Temp:260°C±5°C 5~10 SEC 6 Min 22 PCS 0/1 2 Temperature Cycle H:+100°C 15min ∫ 5min L:-40°C 15min 300 Cycles 22 PCS 0/1 3 Thermal Shock H:+100°C 5min ∫ 10 sec L:-10°C 5min 300 Cycles 22 PCS 0/1 4 High Temperature Storage TEMP:100°C 1000 Hrs 22PCS 0/1 5 Low Temperature Storage TEMP:-40°C 1000 Hrs 22 PCS 0/1 6 DC Operating Life TEMP:25°C If=10mA 1000 Hrs 22 PCS 0/1 7 High Temperature / High Humidity 85°C / 85% RH 1000 Hrs 22 PCS Iv≦Ivt*0.5 or VF≧U or VF≦L 0/1 Note:Ivt:The test Iv value of the chip before the reliability test Iv:The test value of the chip that has completed the reliability test U:Upper Specification Limit L: Lower Specification Limit |
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