Everlight Electronics Co., Ltd.

http:\\www.everlight.com

Rev

：1

Page

：6 of 7

Device No

：CDRX-810-010

Prepared date

：2006/12/29

Prepared by

：Kunjiang Xie

ITR8010

█

█

█

The reliability of products shall be satisfied with items listed below.

Confidence level：90%

LTPD：10%

NO.

Item

Test Condition

Test

Hours/

Cycle

Sample

Size

Failure

Judgement

Criteria

Ac/R

e

1

Solder

Heat

TEMP : 260℃ ± 5 ℃

10 sec 22 PCs

0/1

2

Temperature

Cycle

H : +100

℃

15 min

5 min

L : -40

℃

15 min

300

cycle

22 PCs

Ee≦L×0.8

0/1

3

Thermal Shock

H : +100

℃

5 min

10 sec

L : -10

℃

5 min

300

cycle

22 PCs

U :Upper

specification

limit

L :the initial

test value

0/1

4

High

Temperature

Storage

TEMP. : +100

℃

1000

hrs

22 PCs

0/1

5

Low

Temperature

Storage

TEMP. : -40

℃

1000

hrs

22 PCs

0/1

6

DC Operating

Life

1000

hrs

22 PCs

0/1

7

High

Temperature /

High Humidity

85

℃ / 85% R.H.

1000

hrs

22 PCs

0/1