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L1M-1N8S-10 Datasheet(PDF) 6 Page - Superworld Electronics |
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L1M-1N8S-10 Datasheet(HTML) 6 Page - Superworld Electronics |
6 / 10 page SUPERWORLD ELECTRONICS (S) PTE LTD PG. 6 not be allowed. Appearance : Cracking, shipping & any other defects harmful to the characteristics should The ferrite should not be damaged by forces applied on the right condition. Random Vibration Test Bending Strength ITEM 1.0(0.039) R0.5(0.02) mutually perpendicular directions (Total 9hours). Amplitude : 1.52mm Frequency : 10-55-10Hz for 15 min. Directions & times : X, Y, Z directions for 15 min. This cycle shall be performed 12 times in each of three A PERFORMANCE TEST CONDITION Chip Temperature Life testing at High Humidity : 90~95% RH. Temperature : 60± 2° C Duration : 504± 8hrs Duration : 1008± 12hrs Applied Current : rated current Temperature : 105± 2° C Measured at room temperature after placing for 2 to 3hrs. Measured at room temperature after placing for 2 to 3hrs. Humidity Measured : 500 times Appearance : No damage. Phase Inductance : within± 10%of initial value. Low temperature storage test Thermal Shock Number of cycles : 500 Step2 : +105± 2° C 30± 5 min. Duration : 500± 8hrs Temperature : -40± 2° C Measured at room temperature after placing for 2 to 3hrs. Measured at room temperature after placing for 2 to 3hrs. -40± 2° C 2 1 30± 5 Step1 : -40± 2° C 30± 5 min. Condition for 1 cycle Temperature (° C) Times (min.) height of 75cm. Drop 10 times on a concrete floor from a Drop a. No mechanical damage b. Inductance change: Within ± 30%. 7. RELIABILITY & TEST CONDITION : room temp. 0.5 ≦ Appearance : No damage. Inductance : within± 10%of initial value. Derating Curve For the ferrite chip bead which withstanding current over 1.5A, as the operating temperature over 85° C, the derating current information is necessary to consider with. For the detail derating of current, please refer to the Derated Current vs. Operating Temperature curve. 2.5 2.70 (0.106) 7 0.80 (0.033) mm (inches) 1.40 (0.055) 2.00 (0.079) 3 4 5 Series name 2 1.0 2.5 0.3 P-Kgf 6 Q : within± 20%of initial value. Q: within± 20%of initial value. 3 +105± 2° C 30± 5 1A 1.5A 3A 2A 6A 5A 4A 4 5 6 2 3 1 0 Derating Operating Temperature(?C) 125 85 Operating Temperature(℃) High Frequency Chip Inductor L1M SERIES 10.11.2011 NOTE : Specifications subject to change without notice. Please check our website for latest information. |
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