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SCM6341ZP12A Datasheet(PDF) 5 Page - Motorola, Inc

Part # SCM6341ZP12A
Description  128K x 24 Bit Static Random Access Memory
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Manufacturer  MOTOROLA [Motorola, Inc]
Direct Link  http://www.freescale.com
Logo MOTOROLA - Motorola, Inc

SCM6341ZP12A Datasheet(HTML) 5 Page - Motorola, Inc

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MCM6341
5
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VDD = 3.3 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted)
(TA = – 40 to + 85°C for Industrial Temperature Offering)
Input Pulse Levels
0 to 3.0 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
2 ns
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Timing Measurement Reference Level
1.5 V
. . . . . . . . . . . . . . .
Output Timing Measurement Reference Level
1.5 V
. . . . . . . . . . . . .
Output Load
See Figure 1
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
READ CYCLE TIMING (See Notes 1, 2, and 3)
P
Sb l
MCM6341–10
MCM6341–11
MCM6341–12
MCM6341–15
Ui
N
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Read Cycle Time
tAVAV
10
11
12
15
ns
4
Address Access Time
tAVQV
10
11
12
15
ns
Enable Access Time
tELQV
10
11
12
15
ns
5
Output Enable Access Time
tGLQV
5
6
6
7
ns
Output Hold from Address Change
tAXQX
3
3
3
3
ns
Enable Low to Output Active
tELQX
3
3
3
3
ns
6, 7, 8
Output Enable Low to Output Active
tGLQX
0
0
0
0
ns
6, 7, 8
Enable High to Output High–Z
tEHQZ
0
5
0
6
0
6
0
7
ns
6, 7, 8
Output Enable High to Output High–Z
tGHQZ
0
5
0
6
0
6
0
7
ns
6, 7, 8
NOTES:
1. W is high for read cycle.
2. Product sensitivities to noise require proper grounding and decoupling of power supplies as well as minimization or elimination of bus
contention conditions during read and write cycles.
3. E1, E2, and E3 are represented by E in this data sheet. E2 is of opposite polarity to E1 and E3.
4. All read cycle timings are referenced from the last valid address to the first transitioning address.
5. Addresses valid prior to or coincident with E going low.
6. At any given voltage and temperature, tEHQZ max t tELQX min, and tGHQZ max t tGLQX min, both for a given device and from device
to device.
7. Transition is measured
± 200 mV from steady–state voltage.
8. This parameter is sampled and not 100% tested.
9. Device is continuously selected (E
≤ VIL, G ≤ VIL).
OUTPUT
Z0 = 50 Ω
RL = 50 Ω
VL = 1.5 V
Figure 1. AC Test Load


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