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CL-L251-MC4W1-C Datasheet(PDF) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
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CL-L251-MC4W1-C Datasheet(HTML) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
6 / 11 page 6/11 6. Reliability (1) Details of the tests (2) Judgment Criteria of Failure for Reliability Test (Ta=25 C) Symbol VF Φv U defines the upper limit of the specified characteristics. S defines the initial value. CL-L251-MC4L reliability test results will be used for CL-L251-MC4W1-C. Symbol CITIZEN ELECTRONICS CO.,LTD. JAPAN IF=480mA Forward Voltage Total Luminous Flux IF=480mA Low Temperature Storage Test Ta=25 C,IF=480 mA× 1000 hours(with Al-fin) Continuous Operation Test DATA SHEET Test Item 100 C × 1000 hours CITILED returned to the normal ambient conditions after the completion of each test. Name CL-L251-MC4W1-C > U × 1.1 Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be Moisture-proof Test < S × 0.85 Thermal Shock Test Judgment Criteria for Failure Ta=50 C,IF=480 mA× 1000 hours(with Al-fin) Test Condition 60 C, 90 %RH for 1000 hours Measuring Item Measuring Condition -40 C × 1000 hours High Temperature Storage Test -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle Ref.CE-P1162 05/11 R1(0711) |
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Similar Description - CL-L251-MC4W1-C_11 |
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