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6. Reliability

(1) Details of the tests

(2) Judgment Criteria of Failure for Reliability Test

(Ta=25 C)

Symbol

Φv

U defines the upper limit of the specified characteristics. S defines the initial value.

CL-L251-MC4L reliability test results will be used for CL-L253E-C7N1-C.

Symbol

CITILED

Name

CL-L253E-C7N1-C

CITIZEN ELECTRONICS CO.,LTD. JAPAN

Note: Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be

-40 C × 1000 hours

High Temperature Storage Test

100 C × 1000 hours

Thermal Shock Test

60 C, 90 %RH for 1000 hours

Continuous Operation Test

Test Condition

DATA SHEET

Test Item

Measuring Item

Forward Voltage

-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle

Judgment Criteria for Failure

Low Temperature Storage Test

Moisture-proof Test

Measuring Condition

< S × 0.85

Total Luminous Flux

> U × 1.1

returned to the normal ambient conditions after the completion of each test.

Ref.CE-P987 03/11