6. Reliability

（１）

Datails of the tests

(2)Judgement Criteria of Failure for Reliability Test

(Ta=25

℃

)

U defines the upper limit of the specified characteristics. S defines the initial value.

Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be

return to the normal ambient conditions after the completion of each test.

Thermal Shock Test

Low Temperature Storage Test

Continuous Operation Test

Recommended temperature profile (reflow soldering)× 2,

(2nd test must be started after the samples are stabilized thermally.)

-40 C × 1000 hours

100 C × 1000 hours

60 C, 90 %RH for 500 hours

φv

Solder heat resistance test

Test Item

Test Condition

Symbol

Measuring Condition Judgement Criteria for Failure

Measuring Item

High Temperature Storage Test

Moisture-proof Test

DATA SHEET

>U X 1.1

<S X 0.70

Forward Voltage

Total Luminous Flux

6/12

-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle

VF

CITILED

Name

CL-L430-MC1W1-A

CITIZEN ELECTRONICS CO.,LTD. JAPAN

Symbol

Ref.CE-P1595

10/11