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CL-L430-MC1W1-A-T Datasheet(PDF) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
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CL-L430-MC1W1-A-T Datasheet(HTML) 6 Page - CITIZEN ELECTRONICS CO., LTD. |
6 / 12 page 6. Reliability (1) Datails of the tests (2)Judgement Criteria of Failure for Reliability Test (Ta=25 ℃ ) U defines the upper limit of the specified characteristics. S defines the initial value. Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be return to the normal ambient conditions after the completion of each test. Thermal Shock Test Low Temperature Storage Test Continuous Operation Test Recommended temperature profile (reflow soldering)× 2, (2nd test must be started after the samples are stabilized thermally.) Ta=25 C, IF=350mA× 1000 hours -40 C × 1000 hours 100 C × 1000 hours 60 C, 90 %RH for 500 hours φv Solder heat resistance test Test Item Test Condition Symbol Measuring Condition Judgement Criteria for Failure Measuring Item High Temperature Storage Test Moisture-proof Test DATA SHEET >U X 1.1 <S X 0.70 IF=350mA Forward Voltage Total Luminous Flux 6/12 -40 C × 30 minutes – 100 C × 30 minutes, 100 cycle IF=350mA VF CITILED Name CL-L430-MC1W1-A CITIZEN ELECTRONICS CO.,LTD. JAPAN Symbol Ref.CE-P1595 10/11 |
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