6. Reliability

（１）

Datails of the tests

(2)Judgement Criteria of Failure for Reliability Test

(Ta=25

℃

)

U defines the upper limit of the specified characteristics. S defines the initial value.

Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be

return to the normal ambient conditions after the completion of each test.

CITILED

Name

CL-L430-MC1WW1-A

CITIZEN ELECTRONICS CO.,LTD. JAPAN

Symbol

DATA SHEET

>U X 1.1

<S X 0.70

Forward Voltage

Total Luminous Flux

6/12

-40 C × 30 minutes – 100 C × 30 minutes, 100 cycle

VF

φv

Solder heat resistance test

Test Item

Test Condition

Symbol

Measuring Condition Judgement Criteria for Failure

Measuring Item

High Temperature Storage Test

Moisture-proof Test

Thermal Shock Test

Low Temperature Storage Test

Continuous Operation Test

Recommended temperature profile (reflow soldering)× 2,

(2nd test must be started after the samples are stabilized thermally.)

-40 C × 1000 hours

100 C × 1000 hours

60 C, 90 %RH for 500 hours

Ref.CE-P1597

10/11