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N-HFA08TB120 Datasheet(PDF) 5 Page - Nell Semiconductor Co., Ltd

Part No. N-HFA08TB120
Description  FRED Ultrafast Soft Recovery Diode, 8 A
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Maker  NELLSEMI [Nell Semiconductor Co., Ltd]
Homepage  http://www.nellsemi.com
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 5 page
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Fig.9 Reverse Recovery Parameter Test Circuit
Fig.10 Reverse Recovery Waveform and Definitions
IRFP250
D.U.T.
L = 70 µH
V
R = 200 V
0.01Ω
G
D
S
dIF/dt
adjust
Q
rr
0.5 IRRM
dI
(rec)M/dt
0.75 I RRM
I
RRM
t
rr
t
b
t
a
I
F
dI
F/dt
0
(1)
(2)
(3)
(4)
(5)
(1) dI /dt - rate of change of current
F
through zero crossing
(2) I
RRM - peak reverse recovery current
(3) t
- reverse recovery time measured
rr
from zero crossing point of negative
going I to point where a line passing
F
through 0.75 I
RRM and 0.50 IRRM
extrapolated to zero current.
(4) Q - area under curve defined by t
rr
rr
IRRM
x I
rr
RRM
2
Q
=
rr
(5) dI
/ -
dt
peak rate of change of
(rec)M
current during tbportion of trr
SEMICONDUCTOR
RoHS
RoHS
Page 5 of 6
Nell High Power Products
and
t
N-HFA08TB120
www.nellsemi.com




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