OPA2277-DIE

www.ti.com

SBOS611 – MARCH 2012

HIGH-PRECISION OPERATIONAL AMPLIFIER

Check for Samples: OPA2277-DIE

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FEATURES

•

Ultra Low Offset Voltage

APPLICATIONS

•

Ultra Low Drift

•

Transducer Amplifier

•

High Open-Loop Gain

•

Bridge Amplifier

•

High Common-Mode Rejection

•

Temperature Measurements

•

High Power Supply Rejection

•

Strain Gage Amplifier

•

Low Bias Current

•

Precision Integrator

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Wide Supply Range: ±2V to ±18V

•

Battery Powered Instruments

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Low Quiescent Current

•

Test Equipment

DESCRIPTION

The OPA2277 precision op amp replaces the industry standard OP-177. It offers improved noise, wider output

voltage swing, and are twice as fast with half the quiescent current. Features include ultra low offset voltage and

drift, low bias current, high common-mode rejection, and high power supply rejection.

The OPA2277 op amp operates from ±2V to ±18V supplies with excellent performance. Unlike most op amps

which are specified at only one supply voltage, the OPA2277 is specified for real-world applications; a single limit

applies over the ±5V to ±15V supply range. High performance is maintained as the amplifiers swing to their

specified limits.

The OPA2277 op amp is easy to use and free from phase inversion and overload problems found in some other

op amps. It is stable in unity gain and provides excellent dynamic behavior over a wide range of load conditions.

The dual version features completely independent circuitry for lowest crosstalk and freedom from interaction,

even when overdriven or overloaded.

PACKAGE

PRODUCT

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

DESIGNATOR

OPA2277TDD1

252

Bare Die In Waffle

OPA2277

TD

OPA2277TDD2

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(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality

Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room

temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not

warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2012, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.