TLV3201

TLV3202

SBOS561A – MARCH 2012 – REVISED JUNE 2012

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

PACKAGE

PRODUCT

DESIGNATOR

PACKAGE MARKING

ORDERING NUMBER

SOT23-5

DBV

RAI

TLV3201AIDBV

TLV3201

SC70-5

DCK

SDP

TLV3201AIDCK

SOIC-8

D

TL3202

TLV3202AID

TLV3202

MSOP-8

DGK

VUDC

TLV3202AIDGK

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

(2)

Package drawings, standard packing quantities, thermal data, symbolization, and printed circuit board (PCB) design guidelines are

available at www.ti.com/sc/package.

ABSOLUTE MAXIMUM RATINGS

(1)

Over operating free-air temperature range, unless otherwise noted.

VALUE

UNIT

Supply voltage

7

V

V

Signal input terminals

±10

mA

100

mA

Operating temperature range

–55 to +125

°C

–65 to +150

°C

+150

°C

Electrostatic discharge (ESD)

Human body model (HBM)

2000

V

ratings TLV3201

Electrostatic discharge (ESD)

Human body model (HBM)

1000

V

ratings TLV3202

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values are with respect to the network ground terminal.

(3)

Short-circuit to ground.

2

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