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TLV3201AIDBVT Datasheet(PDF) 2 Page - Texas Instruments |
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TLV3201AIDBVT Datasheet(HTML) 2 Page - Texas Instruments |
2 / 26 page TLV3201 TLV3202 SBOS561A – MARCH 2012 – REVISED JUNE 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE ORDERING INFORMATION(1) PACKAGE PRODUCT PACKAGE-LEAD(2) DESIGNATOR PACKAGE MARKING ORDERING NUMBER SOT23-5 DBV RAI TLV3201AIDBV TLV3201 SC70-5 DCK SDP TLV3201AIDCK SOIC-8 D TL3202 TLV3202AID TLV3202 MSOP-8 DGK VUDC TLV3202AIDGK (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. (2) Package drawings, standard packing quantities, thermal data, symbolization, and printed circuit board (PCB) design guidelines are available at www.ti.com/sc/package. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. VALUE UNIT Supply voltage 7 V Voltage(2) –0.5 to (VCC) + 0.5 V Signal input terminals Current(2) ±10 mA Output short circuit(3) 100 mA Operating temperature range –55 to +125 °C Storage temperature range, Tstg –65 to +150 °C Junction temperature, TJ +150 °C Electrostatic discharge (ESD) Human body model (HBM) 2000 V ratings TLV3201 Electrostatic discharge (ESD) Human body model (HBM) 1000 V ratings TLV3202 (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) All voltage values are with respect to the network ground terminal. (3) Short-circuit to ground. 2 Copyright © 2012, Texas Instruments Incorporated |
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