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MPCG0740LR42C Datasheet(PDF) 2 Page - Texas Instruments |
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MPCG0740LR42C Datasheet(HTML) 2 Page - Texas Instruments |
2 / 27 page TPS51463 SLUSAX2 – FEBRUARY 2012 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ORDERING INFORMATION(1) MINIMUM TA PACKAGE(2) ORDERING NUMBER PINS OUTPUT SUPPLY ECO PLAN QUANTITY TPS51463RGER 24 Tape and reel 3000 Green (RoHS and Plastic QFN -40°C to 85°C no Pb/Br) (RGE) TPS51463RGET 24 Mini reel 250 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the TI website at www.ti.com. (2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. THERMAL INFORMATION TPS51463 THERMAL METRIC(1) UNITS RGE (24) PIN θJA Junction-to-ambient thermal resistance 38.3 θJCtop Junction-to-case (top) thermal resistance 44.7 θJB Junction-to-board thermal resistance 16 °C/W ψJT Junction-to-top characterization parameter 0.8 ψJB Junction-to-board characterization parameter 16.1 θJCbot Junction-to-case (bottom) thermal resistance 5.4 (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) VALUE UNIT MIN MAX VIN, EN, MODE –0.3 7.0 V5DRV, V5FILT, VBST (with respect to SW) –0.3 7.0 Input voltage range VBST –0.3 12.5 V VID0, VID1 –0.3 3.6 VOUT –1.0 3.6 SW –2.0 7.0 SW (transient 20 ns and E=5 µJ) –3.5 Output voltage range COMP, SLEW, VREF –0.3 3.6 V PGND –0.3 0.3 PGOOD –0.3 7.0 Human Body Model (HBM) 2000 Electrostatic Discharge V Charged Device Model (CDM) 500 Storage temperature Tstg –55 150 ˚C Junction temperature TJ –40 150 ˚C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 300 ˚C (1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated Product Folder Link(s): TPS51463 |
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