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CY7C131-25NXC Datasheet(PDF) 9 Page - Cypress Semiconductor |
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CY7C131-25NXC Datasheet(HTML) 9 Page - Cypress Semiconductor |
9 / 22 page CY7C130, CY7C130A CY7C131, CY7C131A Document Number: 38-06002 Rev. *H Page 9 of 22 Switching Characteristics Over the Operating Range[23, 24] Parameter Description 7C130-35 7C131-35 7C140-35 7C141-35 7C130-45 7C131-45 7C140-45 7C141-45 7C130-55 7C131-55 7C140-55 7C141-55 Unit Min Max Min Max Min Max Read Cycle tRC Read cycle time 35 – 45 – 55 – ns tAA Address to data valid[25] – 35 – 45–55 ns tOHA Data hold from address change 0 – 0 – 0 – ns tACE CE LOW to data valid[25] – 35 – 45–55 ns tDOE OE LOW to data valid[25] – 20 – 25–25 ns tLZOE OE LOW to low Z[26, 27, 28] 3 – 3 –3– ns tHZOE OE HIGH to high Z[26, 27, 28] – 20 – 20–25 ns tLZCE CE LOW to low Z[26, 27, 28] 5 – 5 –5– ns tHZCE CE HIGH to high Z[26, 27, 28] – 20 – 20–25 ns tPU CE LOW to power-up[26] 0 – 0 –0– ns tPD CE HIGH to power-down[26] – 35 – 35–35 ns Write Cycle[29] tWC Write cycle time 35 – 45 – 55 – ns tSCE CE LOW to write end 30 – 35 – 40 – ns tAW Address set-up to write end 30 – 35 – 40 – ns tHA Address hold from write end 2 – 2 – 2 – ns tSA Address set-up to write start 0 – 0 – 0 – ns tPWE R/W pulse width 25 – 30 – 30 – ns tSD Data set-up to write end 15 – 20 – 20 – ns tHD Data hold from write end 0 – 0 – 0 – ns tHZWE R/W LOW to high Z[28] – 20 – 20–25 ns tLZWE R/W HIGH to low Z[28] 0 – 0 –0– ns Notes 23. See the last page of this specification for Group A subgroup testing information. 24. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V and output loading of the specified IOL/IOH, and 30 pF load capacitance. 25. AC Test Conditions use VOH = 1.6 V and VOL = 1.4 V. 26. This parameter is guaranteed but not tested. 27. At any given temperature and voltage condition for any given device, tHZCE is less than tLZCE and tHZOE is less than tLZOE. 28. tLZCE, tLZWE, tHZOE, tLZOE, tHZCE and tHZWE are tested with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady state voltage. 29. The internal write time of the memory is defined by the overlap of CS LOW and R/W LOW. Both signals must be low to initiate a write and either signal can terminate a write by going high. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write. |
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