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CY7C131-25NXC Datasheet(PDF) 9 Page - Cypress Semiconductor

Part # CY7C131-25NXC
Description  1 K 횞 8 Dual-Port Static RAM
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C131-25NXC Datasheet(HTML) 9 Page - Cypress Semiconductor

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CY7C130, CY7C130A
CY7C131, CY7C131A
Document Number: 38-06002 Rev. *H
Page 9 of 22
Switching Characteristics
Over the Operating Range[23, 24]
Parameter
Description
7C130-35
7C131-35
7C140-35
7C141-35
7C130-45
7C131-45
7C140-45
7C141-45
7C130-55
7C131-55
7C140-55
7C141-55
Unit
Min
Max
Min
Max
Min
Max
Read Cycle
tRC
Read cycle time
35
45
55
ns
tAA
Address to data valid[25]
35
45–55
ns
tOHA
Data hold from address change
0
0
0
ns
tACE
CE LOW to data valid[25]
35
45–55
ns
tDOE
OE LOW to data valid[25]
20
25–25
ns
tLZOE
OE LOW to low Z[26, 27, 28]
3
3
–3–
ns
tHZOE
OE HIGH to high Z[26, 27, 28]
20
20–25
ns
tLZCE
CE LOW to low Z[26, 27, 28]
5
5
–5–
ns
tHZCE
CE HIGH to high Z[26, 27, 28]
20
20–25
ns
tPU
CE LOW to power-up[26]
0
0
–0–
ns
tPD
CE HIGH to power-down[26]
35
35–35
ns
Write Cycle[29]
tWC
Write cycle time
35
45
55
ns
tSCE
CE LOW to write end
30
35
40
ns
tAW
Address set-up to write end
30
35
40
ns
tHA
Address hold from write end
2
2
2
ns
tSA
Address set-up to write start
0
0
0
ns
tPWE
R/W pulse width
25
30
30
ns
tSD
Data set-up to write end
15
20
20
ns
tHD
Data hold from write end
0
0
0
ns
tHZWE
R/W LOW to high Z[28]
20
20–25
ns
tLZWE
R/W HIGH to low Z[28]
0
0
–0–
ns
Notes
23. See the last page of this specification for Group A subgroup testing information.
24. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V and output loading of the specified
IOL/IOH, and 30 pF load capacitance.
25. AC Test Conditions use VOH = 1.6 V and VOL = 1.4 V.
26. This parameter is guaranteed but not tested.
27. At any given temperature and voltage condition for any given device, tHZCE is less than tLZCE and tHZOE is less than tLZOE.
28. tLZCE, tLZWE, tHZOE, tLZOE, tHZCE and tHZWE are tested with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady state voltage.
29. The internal write time of the memory is defined by the overlap of CS LOW and R/W LOW. Both signals must be low to initiate a write and either signal can
terminate a write by going high. The data input setup and hold timing should be referenced to the rising edge of the signal that terminates the write.


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