DOUT

COUT

VM

BAT

VREG

VSS

NC

SCL

TS

SRP

SRN

VREG

PACK +

PACK –

CELLN

CELLP

S

S

D

1

2

3

4

5

6

12

11

10

9

8

7

SDA

10 mW

0.1 µF

0.1 µF

0.1 µF

0. 1 µF

510

bq28550

100

100

SDA

SCL

FUSE

DSG

CHG

13

PWPD

100

100

3.3 K

bq28550

www.ti.com

SLUSAJ2

– SEPTEMBER 2011

Table 2. Pin Descriptions (continued)

PIN NUMBER

PIN NAME

I/O (1)

DESCRIPTION

12

NC

I/O

Pull up to VREG with 3.3-K resistor

13

PWPD

I/O

Thermal Pad. Connect to VSS externally on PCB.

FUNCTIONAL BLOCK DIAGRAM

Figure 2. Block Diagram

ABSOLUTE MAXIMUM RATINGS

All voltages are referenced to the VSS pin. Over operating free-air temperature range (unless otherwise noted)

(1)

PARAMETER

VALUE

UNIT

Regulator input voltage, BAT (Pin 4)

–0.3 V to 6

V

VM terminal voltage (Pin 3)

V

COUT terminal input voltage (Pin 2)

V

DOUT terminal input voltage (Pin 1)

V

All other pins (Pins 5, 7, 8, and 9)

–0.3 to 6

V

SDA (Pin 10)

V

SCL (Pin 11)

V

ESD

Human body model

±2

kV

ESD

Machine model

±200

V

Operating free-air temperature range

–40°C to 85

°C

Storage temperature range

–65°C to 150

°C

(1)

Stresses beyond those listed under

“absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under

“recommended operating

conditions

” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.

RECOMMENDED OPERATING CONDITIONS

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

BAT pin 4 input

2.45

3.6

5.5

V

Copyright

© 2011, Texas Instruments Incorporated

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