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SN74LVTH32373-EP Datasheet(PDF) 1 Page - Texas Instruments |
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SN74LVTH32373-EP Datasheet(HTML) 1 Page - Texas Instruments |
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1 / 13 page  SN74LVTH32373EP 3.3V ABT 32BIT TRANSPARENT DTYPE LATCH WITH 3STATE OUTPUTS SCBS794 − DECEMBER 2003 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Member of the Texas Instruments Widebus+ Family D State-of-the-Art Advanced BiCMOS Technology (ABT) Design for 3.3-V Operation and Low Static-Power Dissipation † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. D Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C D Ioff and Power-Up 3-State Support Hot Insertion D Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) D Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors D Supports Unregulated Battery Operation Down To 2.7 V D Latch-Up Performance Exceeds 500 mA Per JESD 17 D ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) − 1000-V Charged-Device Model (C101) terminal assignments 123456 A 1Q2 1Q1 1OE 1LE 1D1 1D2 B 1Q4 1Q3 GND GND 1D3 1D4 C 1Q6 1Q5 1VCC 1VCC 1D5 1D6 D 1Q8 1Q7 GND GND 1D7 1D8 E 2Q2 2Q1 GND GND 2D1 2D2 F 2Q4 2Q3 1VCC 1VCC 2D3 2D4 G 2Q6 2Q5 GND GND 2D5 2D6 H 2Q7 2Q8 2OE 2LE 2D8 2D7 J 3Q2 3Q1 3OE 3LE 3D1 3D2 K 3Q4 3Q3 GND GND 3D3 3D4 L 3Q6 3Q5 2VCC 2VCC 3D5 3D6 M 3Q8 3Q7 GND GND 3D7 3D8 N 4Q2 4Q1 GND GND 4D1 4D2 P 4Q4 4Q3 2VCC 2VCC 4D3 4D4 R 4Q6 4Q5 GND GND 4D5 4D6 T 4Q7 4Q8 4OE 4LE 4D8 4D7 Copyright 2003, Texas Instruments Incorporated Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Widebus+ is a trademark of Texas Instruments. GKE PACKAGE (TOP VIEW) 1 23456 A B C D E F G H J K L M N P R T |
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