4" 4 mil Stripline

40" 4mil

Stripline

AWG

Jitter

Measurement

CP

SN75LVCP600S

www.ti.com

SLLSE81

– MARCH 2011

ELECTRICAL CHARACTERISTICS (continued)

over recommended operating conditions (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP MAX

UNITS

3Gbps SATA mode

0.26

0.38

Deterministic jitter

0.13

0.24

EQ/DE=1

Residual random jitter

1.16

1.95

ps-rms

EQ/DE=1

6Gbps SATA mode

0.37

0.61

Deterministic jitter

012

0.32

EQ/DE=1

Residual random jitter

1.15

2.2

ps-rms

EQ/DE=1

3Gbps SAS mode

0.25

0.37

Deterministic jitter

0.12

0.23

EQ/DE=1

Residual random jitter

1.11

2.0

ps-rms

EQ/DE=1

6Gbps SAS mode

0.35

0.57

Deterministic jitter

0.10

0.29

EQ/DE=1

Residual random jitter

1.10

2.14

ps-rms

EQ/DE=1

(1)

connector and includes jitter generated at the package connection on the printed circuit board, and at the board interconnect as shown

in Figure 6.

Figure 6. Jitter Measurement Test Condition

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© 2011, Texas Instruments Incorporated

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