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THS4509QRGTRQ1 Datasheet(PDF) 6 Page - Texas Instruments |
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THS4509QRGTRQ1 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 37 page SPECIFICATIONS, VS+ – VS– = 3 V THS4509-Q1 SLOS547 – NOVEMBER 2008........................................................................................................................................................................................... www.ti.com Test conditions unless otherwise noted: VS+ = +1.5 V, VS– = –1.5 V, G = 10 dB, CM = open, VO = 1 Vpp, RF = 349 Ω, RL = 200 Ω differential, TA = 25°C, single-ended input, differential output, input and output referenced to mid-supply TEST PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LEVEL(1) AC Performance G = 6 dB, VO = 100 mVpp 1.9 GHz G = 10 dB, VO = 100 mVpp 1.6 Small-signal bandwidth G = 14 dB, VO = 100 mVpp 625 MHz G = 20 dB, VO = 100 mVpp 260 Gain-bandwidth product G = 20 dB 3 GHz Bandwidth for 0.1-dB flatness G = 10 dB, VO = 1 Vpp 400 MHz Large-signal bandwidth G = 10 dB, VO = 1 Vpp 1.5 GHz Slew rate (differential) 3500 V/ µs Rise time 0.25 ns Fall time 2-V step 0.25 ns Settling time to 1% 1 ns Settling time to 0.1% 10 ns f = 10 MHz –107 Second-order harmonic distortion f = 50 MHz –83 dBc f = 100 MHz –60 f = 10 MHz –87 C Third-order harmonic distortion f = 50 MHz –65 dBc f = 100 MHz –54 fC = 70 MHz –77 200-kHz tone spacing, Second-order intermodulation distortion dBc RL = 499 Ω fC = 140 MHz –54 fC = 70 MHz –77 200-kHz tone spacing, Third-order intermodulation distortion dBc RL = 499 Ω fC = 140 MHz –62 fC = 70 MHz 72 200-kHz tone spacing Second-order output intercept point dBm RL = 100 Ω fC = 140 MHz 52 fC = 70 MHz 38.5 200-kHz tone spacing Third-order output intercept point dBm RL = 100 Ω fC = 140 MHz 30 fC = 70 MHz 2.2 1-dB compression point dBm fC = 140 MHz 0.25 Noise figure 50- Ω system, 10 MHz 17.1 dB Input voltage noise f > 10 MHz 1.9 nV/ √Hz Input current noise f > 10 MHz 2.2 pA/ √Hz DC Performance Open-loop voltage gain (AOL) 68 dB Input offset voltage TA = 25°C 1 mV Average offset voltage drift TA = –40°C to 125°C 2.6 V/°C Input bias current TA = 25°C 6 A C Average bias current drift TA = –40°C to 125°C 20 nA/°C Input offset current TA = 25°C 1.6 A Average offset current drift TA = –40°C to 125°C 4 nA/°C (1) Test levels: A = 100% tested at 25°C, overtemperature limits by characterization and simulation; B = Limits set by characterization and simulation; C = Typical value only for information. 6 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): THS4509-Q1 |
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