© 2011 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FSL206MR • Rev. 1.0.5

4

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

Symbol

Parameter

Min.

Max.

Unit

-0.3

650.0

V

Drain Pin Voltage

-0.3

650.0

V

Supply Voltage

26

V

LS Pin Voltage

-0.3

Internally Clamped

Voltage

(4)

V

Feedback Voltage Range

-0.3

Internally Clamped

Voltage

(4)

V

Drain Current Pulsed

(5)

1.5

A

Single-Pulsed Avalanche Energy

(6)

11

mJ

Total Power Dissipation

1.3

W

Operating Junction Temperature

-40

+150

°C

Operating Ambient Temperature

-40

+125

°C

Storage Temperature

-55

+150

°C

ESD

Human Body Model, JESD22-A114

4

KV

Charged Device Model, JESD22-C101

2

Notes:

4.

5.

Repetitive rating: pulse-width limited by maximum junction temperature.

6.

Thermal Impedance

Symbol

Parameter

Value

Unit

Junction-to-Ambient Thermal Impedance

(7)

93

°C/W

Notes:

7.

JEDEC recommended environment, JESD51-2 and test board, JESD51-10 with minimum land pattern for 8DIP

and JESD51-3 with minimum land pattern for 8LSOP.