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SN65HVD11HD Datasheet(PDF) 9 Page - Texas Instruments

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Part # SN65HVD11HD
Description  3.3-V RS-485 TRANSCEIVER
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SN65HVD11HD Datasheet(HTML) 9 Page - Texas Instruments

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SN65HVD11-HT
www.ti.com
SLLS934E – NOVEMBER 2008 – REVISED JUNE 2012
RECEIVER SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
TA = –55°C to 125°C
TA = 175°C
(1)
TA = 210°C
(2)
PARAMETER
TEST CONDITIONS
UNIT
MIN
TYP
MAX
MIN
TYP
MAX
MIN
TYP
MAX
Propagation delay time,
tPLH
30
55
70
30
55
70
30
55
70
ns
low-to-high-level output
VID = –1.5 V to 1.5 V,
Propagation delay time,
tPHL
30
55
70
30
55
70
30
55
70
ns
CL = 15 pF,
high-to-low-level output
See Figure 9
tsk(p)
Pulse skew (|tPHL – tPLH|)
4
4
4
ns
tsk(pp)
(3)
Part-to-part skew
15
15
15
ns
tr
Output signal rise time
1
3
5
1
4
5
1
4
5
ns
CL = 15 pF,
See Figure 9
tf
Output signal fall time
1
3
5
1
4
5
1
4
5
ns
Output enable time to high
tPZH
(2)
15
15
15
ns
level
Output enable time to low
tPZL
(2)
15
15
15
ns
level
CL = 15 pF, DE = 3 V,
See Figure 10
Output disable time from
tPHZ
20
20
20
ns
high level
Output disable time from
tPLZ
15
15
15
ns
low level
Propagation delay time,
tPZH
(3)
standby-to-high-level
6
6
6
μs
CL = 15 pF, DE = 0,
output
See Figure 11
Propagation delay time,
tPZL
(3)
6
6
6
μs
standby-to-low-level output
(1)
Minimum and maximum parameters are characterized for operation at TA = 175°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(2)
Minimum and maximum parameters are characterized for operation at TA = 210°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(3)
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
Copyright © 2008–2012, Texas Instruments Incorporated
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