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TPS84410RKG Datasheet(PDF) 4 Page - Texas Instruments |
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TPS84410RKG Datasheet(HTML) 4 Page - Texas Instruments |
4 / 13 page TP16 TP15 Metal Ground Barrel Probe Tip Getting Started www.ti.com The V IN scope and VOUT scope test points can be used to monitor VIN and VOUT waveforms with an oscilloscope. These test points are intended for use with un-hooded scope probes. The scope probe tip should be connected to the socket labeled VIN or VOUT, and the scope ground barrel should lean against to the test point labeled GND. The GND TP may need to be cut or bent slightly to hold the probe barrel. Figure 2. Tip and Barrel Measurement The control test points located directly below the TPS84x10 IPS device are made available to test the features of the device. Any external connections made to these test points should be referenced to either of the two control ground test points located along the bottom of the EVM. Refer to Section 4 of this user guide for more information on the individual control test points. The V OUT-select and FSW-select configuration jumpers are provided for selecting the desired output voltage and appropriate switching frequency. Before applying power to the EVM, ensure that the jumpers are present and properly positioned for the intended output voltage. Refer to Table 2 for the recommended jumper settings. Always remove input power before changing the jumper settings. Once the jumper settings have been confirmed, configure the host input supply to apply the appropriate bus voltage listed in Table 2 and confirm that the selected output voltage is obtained. Table 2. Output Voltage and Switching Frequency Jumper Settings V OUT SELECT TPS84210, F SW TPS84410, F SW TPS84610, F SW V IN BUS VOLTAGE SELECT SELECT SELECT 3.3 V 1.5 MHz 1 MHz - 5 V 2.5 V 1.5 MHz 1 MHz - 5 V 1.8 V 1 MHz 1 MHz - 5 V or 3.3 V 1.2 V 750 kHz 750 kHz - 5 V or 3.3 V 0.8 V 650 kHz 650 kHz - 5 V or 3.3 V 4 TPS84410EVM-001/TPS84210EVM-002/TPS84610EVM-003, 2-A to 6-A SLUU633A – September 2011 – Revised February 2012 Integrated Power Solution Submit Documentation Feedback Copyright © 2011–2012, Texas Instruments Incorporated |
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