ADS1118

SBAS457B – OCTOBER 2010 – REVISED AUGUST 2012

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum at the end of this

document, or visit the device product folder on www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

ADS1118

UNIT

VDD to GND

–0.3 to +5.5

V

Analog input current

100, momentary

mA

Analog input current

10, continuous

mA

Analog input voltage to GND

–0.3 to VDD + 0.3

V

DIN, DOUT/DRDY, SCLK, CS voltage to GND

–0.3 to +5.5

V

Human body model (HBM)

±4000

V

JEDEC standard 22, test method A114-C.01, all pins

ESD ratings

Charged device model (CDM)

±1000

V

JEDEC standard 22, test method C101, all pins

Operating temperature range

–40 to +125

°C

Maximum junction temperature

+150

°C

Storage temperature range

–60 to +150

°C

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

PRODUCT FAMILY

INPUT CHANNELS

RESOLUTION

MAXIMUM SAMPLE

SPECIAL

(Differential/

DEVICE

(Bits)

RATE (SPS)

FEATURES

PGA

INTERFACE

Single-Ended)

ADS1118

16

860

Temperature sensor

Yes

SPI

2/4

ADS1018

12

3300

Temperature sensor

Yes

SPI

2/4

ADS1115

16

860

Comparator

Yes

2/4

ADS1114

16

860

Comparator

Yes

1/1

ADS1113

16

860

None

No

1/1

ADS1015

12

3300

Comparator

Yes

2/4

ADS1014

12

3300

Comparator

Yes

1/1

ADS1013

12

3300

None

No

1/1

2

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