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CY62148EV30LL-55SXI Datasheet(PDF) 6 Page - Cypress Semiconductor |
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CY62148EV30LL-55SXI Datasheet(HTML) 6 Page - Cypress Semiconductor |
6 / 18 page CY62148EV30 MoBL® Document Number: 38-05576 Rev. *O Page 6 of 18 Data Retention Characteristics Over the Operating Range Parameter Description Conditions Min Typ [13] Max Unit VDR VCC for data retention 1.5 – – V ICCDR [14] Data retention current VCC = 1.5 V, CE > VCC – 0.2 V, VIN > VCC – 0.2 V or VIN < 0.2 V Industrial / Automotive-A –0.8 7 A tCDR [15] Chip deselect to data retention time 0– – ns tR [16] Operation recovery time CY62148EV30LL-45 45 – – ns CY62148EV30LL-55 55 – – ns Data Retention Waveform Figure 2. Data Retention Waveform VCC(min) VCC(min) tCDR VDR > 1.5 V DATA RETENTION MODE tR VCC CE Notes 13. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C. 14. Chip Enable (CE) must be HIGH at CMOS level to meet the ISB1 / ISB2 / ICCDR spec. Other inputs can be left floating. 15. Tested initially and after any design or process changes that may affect these parameters. 16. Full device AC operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) > 100 s. |
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